Exhibitor Seminars
TSS6
Interpreter
TechSTAGE SOUTH, East Hall 1, TOKYO BIG SIGHT
15:10-16:50 Thu., 15-Dec
STS Test Session
Testing Technology for IoT Devices
Sponsored by
Session Description
IoT devices are growing steadily, and all kinds of objects in daily life are being connected to the Internet. This session will feature presentations on test technology required in the development and mass production of IoT devices by speakers at the forefront of the sector.
Program Agenda
Mitsuhiro Ogura, Teradyne K.K.
Koji Urata, TOSHIBA SEMICONDUCTOR SERVICE&SUPPORT Co., Ltd.
15:10-15:40
State-of-the-Art Test Technologies Presented in ITC2016
Masahiro Ishida
Manager
FT Technology R&D Section 2, 5th R&D Department, Technology Development Group
Advantest Corporation
In this lecture, I present the latest researches and trends in test technology from papers, presentations and co-located events of ITC2016 (2016 International Test Conference) held in Fort Worth, Texas, USA, November 13-18, 2016.
15:40-16:10
Proposal for the sensor test process to succeed in IoT market
Hiroshi Sakamoto
Principal Engineer/Manager
Xcerra Corporation
The semiconductor industry spreads to smart cities, home automation, connected vehicles, health care / health monitored by IoT.
Over double figures growth in mass production, merciless cost pressure and corresponding to sensors of variety are required to succeed in this market.
We introduce the advanced mass production test technique of various sensors.
16:10-16:40
DSP Techniques Support RF Test
Hideo Okawara
Principal Consultant
New Business Development
ATE SERVICE CORPORATION
“IoT” is one of the most popular buzzwords today. Then many devices are designed digital-oriented and contain RF systems inside too. Consequently ATE is required to source and measure RF signals for testing such devices. There are lots of circuit components, wiring and printed patterns between testing devices and measurement equipment. The frequency response of the components and transmission lines deteriorate device output signal integrity. ATE needs to make the influence of the transmission network minimum for evaluating the devices correctly. Estimating the equivalent circuit of signal paths or measuring the s-parameters of the transmission network, DSP techniques can compensate the degradation of signal. This session presents examples of equalization compensation and TDR (time domain reflectometry) by the s-parameters, showing how DSP techniques contribute to improving RF test quality.